Specs, capabilities:
- Schottky FEG electron source
- Operation at accelerating voltages up to 300 keV
- TEM point-to-point resolution of 0.21 nm
- STEM point-to-point resolution of 0.34 nm
- Gatan OneView 4k CCD camera with in-situ upgrade enabling high-spatial- and high-temporal-resolution data collection
- 4K x 4K @ 25 FPS
- 2K x 2K @ 100 FPS
- 1K x 1K @ 200 FPS
- 512 x 512 @ 300 FPS
- High-angle annular dark field (HAADF), annular dark field (ADF), and bright field (BF) STEM detectors enable flexible imaging conditions
- Energy-dispersive x-ray (EDS) microanalysis using a Si(Li)-based EDAX detector and embedded software
- TEM and STEM tomography integrated
- Film plate imaging system, for the old-timers, or those needing exceptional dynamic range
- FEI Twin objective lens with a wide pole-piece gap enabling alpha-tilting of up to ±70°
- Excellent platform for in-situ heating/cooling/straining studies
Highlighted Techniques:
- Wide pole piece gap facilitates the use of a broad spectrum of in situ TEM holders
- Diffraction-based analyses benefit from the extended tilt-range